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Firmware:     Build 262
Release Date: $Date: 2020-07-14 09:03:46 +0200 (Di., 14 Jul 2020) $
SVN Revision: $Revision: 34351 $
Remark:       Version for new generation Drives TSD80/130 Rev3++, TSD350 and TSP710

Changes since last Build:
- set new FW version to 262; batch file modified for the new version
- CHG: replaced HardwareRevision by HardwareCompatibility
- FIX: use of ASSERT() corrected and simplified
- CHG: exchanged ADC_17 and ADC_18 with ADC_8 and ADC_9 to improve DC Bus signal
       quality in BM of TSP710. (fast signals are noisy when converted in sequence B)
- CHG: simplified and optimized median filter algorithm
- CHG: implemented individually configurable ADC-DMA sequences
- CHG: made ADC-DMA channel setup more convenient (sequence ranks are configurable now)
- CHG: changed ADC-DMA mechanism to be able to transfer 11 channels in sequence A
       and 3 channels in sequence B (sequence B conversion results are more noisier)
- CHG: arranged the ADC channels into the enlarged sequence A and down scaled
       sequence B. Put all possible channels into A. (see Kinestis_AdcChannel.ods)
- CHG: take a copy of unfiltered ADC values to prevent conflicts between ADC-DMA
       and application code which may use the ADC values.
- CHG: perform update of high speed signal registers after conversion complete
       instead of calling it in SPI interrupt
- CHG: correct number of slow sequence lengths for some devices
- CHG: changed Pin configuration concept of ADC pins. moved ADC pin configuration
       to ADC channel registration
- CHG: removed slow channels first order lowPass filters and implemented simple
       moving averaging filter for all slow signals
- CHG: reduced ADC sampling time to get less noisy conversion results
- CHG: implemented calibration of MCU temperature within bandgap voltage measurement
- INT: implemented method which can be used for testing ADC noise (activate within
       define ADC_NOISE_TEST in SAD_AdcChannels.h)


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Firmware:     Build 261
Release Date: Date: 2019-05-08 15:24:59 +0200 (Mi, 08 Mai 2019)
SVN Revision: Revision: 30675
Remark:       Version for new generation Drives TSD80/130 Rev3++, TSD350 and TSP710

Changes since last Build:
- set new FW version to 261; batch file modified for the new version
- CHG: prevent from static code analyse checker warning (use NVIC_EncodePriority
       for prio calculation)
- CHG: redesign of temperature measurement and resistor network classes to suppress
       static code checker warnings
- NEW: reserved register entry 0x88 for digital inputs (all monitors)
- NEW: defined register entry 0x89 for device state for all monitors
- NEW: added register entry 0x94 for register general.internal.event (all monitors)
- NEW: added Kinetic specific macros for port registers to improve code readability


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Firmware:     Build 260
Release Date: Date: 2019-01-30 16:26:13 +0100 (Mi, 30 Jan 2019)
SVN Revision: Revision: 29773
Remark:       Version for new generation Drives TSD80/130 Rev3++ and TSD350

Changes since last Build:
- set new FW version to 260; batch file modified for the new version
Base and App:
- CHG: introduced #define USE_DEBUG_PINS which is used for control
       of DebugPin setup and DebugPin macros (inactive per default)
- NEW: added unique chip ID registers read mechanism. The CHIP UID is available
       in monitor LocalBus registers 0x4..0x7
- CHG: replaced all include guards with #pragma once
- INT: removed all C# //#region, //#endregion, ///<summary> and updated all copy rights
- CHG: applied static code checker suggestions
- INT: moved FilterLib sources to common Folder monitor_Lib
- INT: moved basicTypes.h and assert.c/h to Monitor_Common dir
- INT: moved STI_Timer, SRA_Ram, SCR_CrcXX sources to Monitor_Common dir
- INT: moved KTY_TempSens, NTC_TempSens, PTS_TempSens sources to Monitor_Common dir
- CHG: no longer perform CRC backward compatibility mode check
- CHG: removed MaintCount related definitions/implementations from flash map and code
- CHG: Prevent from potentially possible watchdog problems during FW download.
       Added 5ms delay between every sector erase operation
- CHG: derive specific register parts from general register parts, implement
       specific register parts in application project
- CHG: changed register ID of ResetMonitorStatistic from 0x9F to 0x93


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Firmware:     Build 259
Release Date: Date: 2018-08-27 11:40:04 +0200 (Mo, 27 Aug 2018)
SVN Revision: Revision: 28223
Remark:       Version for new generation Drives TSD80/130 Rev3++ and TSD350

Changes since last Build:
- set new FW version to 259; batch file modified for the new version
- CHG: calibrate mesured ADC voltages using the measured bandgap voltage
- CHG: changed default bandgap supervision voltage to 1.015V (see Device at line 298)
- INT: removed unused ADC resolution factors


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Firmware:     Build 258
Release Date: Date: 2018-08-06 14:45:23 +0200 (Mo, 06 Aug 2018)
SVN Revision: Revision: 28085
Remark:       Version for new generation Drives TSD80/130 Rev3++ and TSD350

Changes since last Build:
- set new FW version to 258; batch file modified for the new version
- FIX: correct calculation of subscription register pointer (suggestion of c-stat)
- CHG: implemented suggestions made by c-stat code analyzer
- CHG: introduced default publication and subscriprion register, made sure
       publications and subscriptions are at these defaults after construction.


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Firmware:     Build 257 (1.1)
Release Date: Date: 2018-07-02 15:30:39 +0200 (Mo, 02 Jul 2018)
SVN Revision: Revision: 27850
Remark:       Version for new generation Drives TSD80/130 Rev3++ and TSD350

Changes since last Build:
- set new FW version to 257 (1.1); batch file modified for the new version
- CHG: adapted for the TSD80 prototype TCU Monitor
- DEL: removed Analog channels EncSupply and LogicSupply
- DEL: removed control for Encoder enable
- FIX: temp level access for temperatures #[8..9] was wrong. could access a wrong
       address. correct calculation of register for access to temp levels #[8..9]
- CHG: changed name TCU1 to TCU inside code
- CHG: changed analog channels ADC channel and slow/fast assignment
- NEW: introduced define for abo index which is used for allErrors update
- INT: use naming convention AX0..AX1 instead of AX1..AX2
- CHG: activated flash read-protection mechanism


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Firmware:     Build 256 (1.0)
Release Date: Date: 2017-11-23 11:02:57 +0100 (Do, 23 Nov 2017)
SVN Revision: Revision: 26256
Remark:       Version for new generation Drive (Prototype for TCU1)

Changes since last Build:
- set new FW version to 256 (1.0); batch file modified for the new version
- initial TCU1 monitor implemented based on TC Monitor
- CHG: made maintenance counting implementation more robust
- CHG: made boot loader jump into images more robust

